| Rank | 13445 |
|---|---|
| Abbreviated Journal | J ELECTRON IMAGING |
| Publisher | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS |
| Year | 2024 |
| ISSN | 1017-9909 |
| eISSN | 1560-229X |
| Total Cites | 2717 |
| Total Articles | 356 |
| Citable Items | 356 |
| Cited Half-Life | 6.7 |
| Citing Half-Life | 5.1 |
| Impact Factor | 1.000 |
| 5-Year JIF | 0.900 |
| JIF Without Self-Cites | 0.800 |
| JCI | 0.250 |
| JIF Quartile | Q4 |
| JIF Rank | 103/125 |