JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS JCR impact factor overview
This profile summarizes the journal metrics and publication information available in the current directory record.
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS metric snapshot
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS has a bibliometric profile in this directory for 2025. The publisher recorded for the journal is SPRINGER. Its listed Clarivate Journal Citation Reports (JCR)-based Journal Impact Factor is 1.300. The five-year Journal Impact Factor is 0.900, giving a second citation window for comparison. The journal is recorded in quartile Q4 for its listed JCR category.
Category position and quartile
The recorded JCR category position is 281 out of 366 journals. Based on that rank position, the journal sits within approximately the top 77% of the listed category. Its listed quartile is Q4. Category ranks and quartiles are field-specific and are not measures of the quality of an individual article.
How the citation indicators compare
The five-year Journal Impact Factor (0.900) is 0.400 points lower than the standard Journal Impact Factor (1.300). Without journal self-citations, the Impact Factor is 1.200, a difference of 0.100 points from the listed standard value. The Journal Citation Indicator (JCI) is recorded as 0.240. These measures use different definitions or citation windows, so they are most useful when read together rather than treated as interchangeable scores.
Citation and publication counts
For 2025, the directory record for JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS lists total cites: 549; total articles: 53; citable items: 53. These fields describe different parts of the JCR record and should not be combined into an article-level quality score.
Citation half-life profile
The cited half-life is 6.4 years, indicating the median age of items that contributed citations to the journal in the reporting framework. The citing half-life is 8.3 years, indicating the median age of references used by the journal’s articles.
Identifiers and verification
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is identified in this directory by print ISSN 0923-8174 and electronic ISSN 1573-0727. The publisher is recorded as SPRINGER. When making submission, library, or research-evaluation decisions, verify the title and identifiers against the journal publisher and the official Clarivate Journal Citation Reports record.
Complete journal information
Use this table to verify the individual metric values, identifiers and publication details stored for this journal.
| Journal name | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS |
|---|---|
| Abbreviated journal | J ELECTRON TEST |
| Publisher | SPRINGER |
| Metric year | 2025 |
| Overall rank | 11,740 |
| ISSN | 0923-8174 |
| eISSN | 1573-0727 |
| Total cites | 549 |
| Total articles | 53 |
| Citable items | 53 |
| Cited half-life | 6.4 years |
| Citing half-life | 8.3 years |
| JCR-based Journal Impact Factor | 1.300 |
| 5-Year Impact Factor | 0.900 |
| Impact Factor without journal self-cites | 1.200 |
| Journal Citation Indicator | 0.240 |
| JCR Impact Factor quartile | Q4 |
| JCR category rank | 281/366 |
| Database record updated |
Frequently asked questions
What is the 2025 JCR-based Journal Impact Factor of JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?
The Journal Impact Factor recorded in this directory as a Clarivate Journal Citation Reports (JCR)-based value for JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is 1.300 for the 2025 metric year.
What are the JCR quartile and category rank of JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is listed with quartile Q4 and category rank 281/366. These values are category-specific and should be verified against the official JCR record when used for formal assessment.
What is the five-year Journal Impact Factor of JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?
The five-year Journal Impact Factor recorded for JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is 0.900. It uses a longer citation window than the standard Journal Impact Factor.
Who publishes JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is listed in this directory as being published by SPRINGER.
Related journal profiles
Additional records from the same publisher or with a similar listed JCR Impact Factor.